A handler for testing semiconductor devices is disclosed which is capable of simplifying the process carried out in an exchanging station, namely, the process of loadingunloading semiconductor devices infrom test trays, and greatly increasing the number of simultaneously testable semiconductor devices. Since the stator is wound in parallel by phases and poles, the motor is realized to generate high power with low voltage and since the stator’s winding is performed without interconnection, automatic production is realized to reduce costs and enable mass production. A single channel MOS inverter 12 connected to a +15 V power source and the 0 V power source provides, in response to the output voltage of the CMOS inverter 11, an output voltage whose H level is +15 V and whose L level is 0 V. The means 14 for coordinating position and support the units in relation to each other before, during and after relative motion between an incident object and the energy absorber.