Methods and systems of semiconductor testing where reference dice and non-reference dice in a wafer andor lot are tested differently. The gate driving circuit includes several stages of gate drivers each for generating a gate driving signal to drive a row of pixels. The method can further include providing a copper solution over the copper plating catalyst, whereby a layer of copper is patterned on the material surface. That is, since the small-sized ultraviolet-ray blocking particles are coated onto and stably fixed into the surface of the infrared-ray blocking particle, it is possible to prevent aggregation of the ultraviolet-ray blocking particles, thereby preventing deterioration in uniformity of adhesion to the skin, and deterioration of the ultraviolet-ray blocking efficiency. The composition exhibits increased mildness to the skin without loss of detergency performance. The method further includes sealing the lid to the chip carrier with the at least one seal shim between the lid and the chip carrier.