A method for fabricating a trench isolation for electrically active components in a semiconductor component. The apparatus of the present invention further comprises: a power supplier, a switcher, a plurality of detection circuits, and a plurality of connecting line, which is used for monitoring the same. A value of a state associated with the network may be identified using various techniques. The channel phase change between the two OFDM symbols is then obtained. A fluorescent bright point extracting unit extracts a fluorescent bright point. The method is easy to control and suitable for mass production.