The present invention provides a system and method for monitoring a short clock cycle on a semiconductor chip. The rubber material of the inner tube rubber layer and intermediate rubber layer is a blend material in which 40 to 80 wt % is IIR and the remainder is EPDM. The incident light beam is collected at any of the incident unit, the bent unit, and the output unit to form an intermediate image of the object, and the intermediate image is formed on the output side of the second lens face to form an erection image of the object. A key frame is inserted into the recesses of the key film and has at least one spacer extended upward for providing space in which the key tops move up and down between the upper casing frame and the key film. An adherent polymeric encapsulant fills the gap so that the encapsulant is free of voids. Admissibility of the one or more sharing arrangements is determined such that a critical time path of the at least one sharing plan does not exceed a staleness level and a cost of the at least one sharing plan does not exceed a capacity.