A test method for an ASIC uses an embedded processor in the ASIC to execute test routines from an embedded memory or an external memory. The positioning unit newly performs the positioning processing for the reference image and the reading target image in the image defect candidate area with a second precision that is higher than the first precision. The processing continues by comparing the at least one associated content control indicator with at least one content control setting. The second sensor is configured to detect a temperature of the air exiting the dehumidifying assembly. The column is disposed within the opening substantially perpendicular to the platform. The system provides for automated generation of a simulated hardware and facilitates testing of embedded software response to simulated error conditions created by the simulated hardware.