The present invention relates generally to an improvement in the ability of test systems to test bit processing capacities of electronic devices, and in particular an improvement in their ability to measure a signal propagation delay through an object connected to an optoelectronic device. An intracranial signal transmission system in accordance with an embodiment of the invention includes a generally electrically insulating body having a head portion configured to be positioned at least proximate to an outer surface of a patient’s skull, and a shaft portion configured to extend into an aperture in the patient’s skull. The transmit portion is provided with a shaft portion extending in one direction, which rotatably supports the cadence sensor and the speed sensor. The terminal block has terminals with ends electrically connected with the traces.