Memory devices and methods are described such as those that monitor and adjust characteristics for various different portions of a given memory device. The EMI-shield-and-snap-retention features partially fasten an EMI shield to the bezel, while also fastening the bezel to a snap attached to an equipment enclosure. The present invention is a system that evaluates the quality of the welds involving inputting an EM pulse to the embedded susceptor and listening to the acoustic response that the pulse generates to determine weld quality from the sound. Similarly, the log may be encapsulated into an object that supports operations that facilitate a multiple-level undoredo. A first representation of the data indicative of the first characteristic is presented in the frame associated with each of the first significant intervals. An array substrate of an LCD device includes an insulation substrate, a gate line, a data line, a thin film transistor connected to the gate line and the data line, a common electrode disposed at a pixel area, a pixel electrode overlapping with the common electrode, and a common line.