The present invention discloses a method and system compensating for thermally induced motion of probe cards used in testing die on a wafer. The method includes receiving an electromagnetic radiation signal, rectifying the signal to produce a direct current voltage and providing the D. Next, a first life reduction amount is calculated from a natural logarithmic function with the number-of-discharges as a variable, and the difference between the expected life value and the first life reduction amount is set to a remaining life value, on the basis of which the life of the nickel-hydride battery is determined. When the controllerdriver is placed in a second mode, on the other hand, the first and second memory sections store sub and main image data respectively associated with images to be displayed on main and sub display panels.