A method and an apparatus for detecting a necking error during semiconductor manufacturing. In particular, the methods and systems disclosed herein enable direct communications from one FCoE device to another without going through any intermediary such as an FCF that is designed to route traffic between FCoE devices according to the current FCoE standards. Second step: first and second optical network units are set to transmission enable status. Intersections of these planes with opaque texture-mapped gray-level views of previously acquired images enable the orientation of a new scan to be viewed in a much more intuitive fashion. In order to reduce damage caused by pumping a gas stream containing liquid or solid particulates, a plurality of grooves is located on the peripheral surface for accommodating the particulates. The plasma oxidation or nitridization is continued until the expandable material is converted to a dielectric and has expanded to fill the space between patterned metal features.