A system predicts die loss for a semiconductor wafer by using a method referred to as universal in-line metric. The CPU outputs a driving signal to the output control circuit, on a basis of an instruction to move the lens, and on the basis of a position of the moving member corresponding to a resistance value detected by the detection circuit. In a specific implementation, a pair of jeans includes a shape contouring panel incorporated onto an inside of the jeans, the panel including a polyurethane based coating with holding power to enhance the body’s natural curves while de-emphasizing the body’s flaws.