A cover peeling machine includes a pair of rolls. The device comprises a shaft oriented in an axial direction, the shaft having a torque transfer section. The at least one microstructure may include a microscale beam configured to be displaced relative to the first structure upon the adaptive structure being exposed to a specified temperature. The determination is made by sending a heartbeat that is designed to fail unless the heartbeat is received by a spoofing device. By enabling partial scan testing based on package information, unintentional yield loss caused by a full scan test determining an SoC is faulty can be avoided.