Most semiconductor devices manufactured today, have uniform dopant concentration, either in the lateral or vertical device active regions. It is determined from which circuit an ATM cell originated by using pre-pending byte andor user defined byte; individual tag are assigned; and at least one tag is decoded corresponding to the point-to-multipoint address. Additionally, the NMS specifies a network configuration and a set time period. A display indicating the score is performed as the display indicating the state of fuel efficiency. The first stress memorization region is proximate the top portion of the gate structure.