According to the invention, an IP core is clocked during a debugging operation by switching from the clock used for testing the device under test to a clock oscillator or any other free-running clock source. An illumination optical system for illuminating a reticle with an illumination light and a projection optical system for projecting the pattern image of the reticle onto a wafer are provided. In some examples the recovery system includes a plurality of decelerators, each decelerator having a supply of a restraint strap, connected to the pneumatic net, which can be pulled from the decelerator upon the application of a sufficient force so that movement of the pneumatic net is resistible by forces exertable by the decelerators on the pneumatic net. Corona discharge electrodes of neighboring stages may be horizontally aligned, complementary collector electrodes of all stages being similarly horizontally aligned between and horizontally offset from the corona discharge electrodes. The invention also relates to a device for implementing this process. In a specific embodiment, the present device has an RF electrodeless plasma lighting assembly integrally coupled to the base member.