A semiconductor device according to the present invention includes a semiconductor substrate and an MEMS sensor provided on the semiconductor substrate. This allows connecting terminals 5 of the sensor power supplying unit 1 and receiving connectors 7 of a DC motor unit 6, which are arranged in proximity to motor brushes 9 of the DC motor unit 6 and which are connected to the connecting terminals 5, to be dispensed with. If the operated degree of influence reaches the reference value, the degree of influence of the 3D image on the viewer is reduced by selectively displaying the result of the judgment on the right and left image display elements, so that the image can be viewed in a consistently suitable manner. Additional system and computer program product embodiments are disclosed and provide related advantages. This approach is used for distributed fault detection in an electrical power distribution network.