A first processor-based device, such as a personal computer functioning as a host and containing digital media files, may share a selected file with a second PBD. and is specifically intended and designed for second optical wafer inspection for such defects as metalization defects, diffusion defects, passivation layer defects, scribing defects, glassivation defects, chips and cracks from sawing, solder bump defects, and bond pad area defects. An upper substrate includes an ink inlet, a plurality of pressure chambers, and a plurality of piezoelectric actuators, a middle substrate includes a manifold, a plurality of restrictors, and a plurality of first dampers, and a lower substrate includes a plurality of nozzles.