In a system and method for measuring total litter in a high speed data processing device, a high-speed data processing device, as an object under test, receives test data and generates differential output data at a high rate. A method for generating a slowness versus depth log is generated for waveform arrivals by classifying long tracks, classifying small tracks; classifying tracks that overlap; filling in gaps; and creating a final log is disclosed. In each generation, half of the groups of values for the parameter subset are selected and used to determine the groups of values for the next generation.