Methods and systems for detecting defects on a wafer using adaptive local thresholding and color filtering are provided. Subsequently, the deviating primary colors of the second printing system are adapted to those of the first printing system in that parts of other primary colors are mixed to the deviating primary color to form a mixed primary color until an adequate similarity to the corresponding primary color of the first printing system has been achieved. Layers of the first polymer material are disposed between layers of the second polymer material. Configurations of computer program products, mobile devices and systems for enabling the determination of various route metrics are also described.