The present invention is directed to a high density test probe which provides a means for testing a high density and high performance integrated circuits in wafer form or as discrete chips. The method comprises receiving input data having a characteristic that the input data cannot be assigned an interpretation by a grammar, translating the input data into translated input data and submitting the translated input data into the grammar. Once the deduplication procedure has been completed, the active file system of the storage system has been deduplicated, however, the target PCPI remains un-deduplicated. The processing capabilities of the node are then burdened by increasing the frequency of protocol data units transmitted to it, so that the node is compelled to treat the two streams differently, if, in fact, it is properly configured to treat them differently. The hypervisor then passes the descriptive name to the guest via a host-to-guest channel, which is a shared storage location writable by the hypervisor and readable by the guest.