The present invention relates to controlling the properties of semiconductor materials at the atomic or molecular level to achieve improved performance within semiconductor devices. The frame assembly comprises a light powered by an electrical circuit connected to the connection and a frame for housing the light. Responsive to receiving a second input through a hands-free input device, a determination that the second input is responsive to the prompt may be made, an operation based on the second input may be performed, and cessation of the output of the prompt may occur. A smoothing filter is applied to the polygon to identify those control sites that may cause an OPC tool to produce erroneous results.