The present invention is directed to a locking apparatus and loadboard assembly of a semiconductor testing device apparatus. In an embodiment, pixels of the pixel array each include three chrominance elements and a fourth luminance element. Moreover, the printing apparatus includes a sheet discharge sensor that detects the sheet to be discharged from the second printing unit. After the water-cooling stage, the extrudate is also subjected to at least one air-cooling stage in which a stream of air is placed into contact with the extrudate.