A wall panel comprises a base layer comprising fiberglass board, an intermediate layer comprising molded fiberglass board, and a facer layer comprising glass textile. Absorb sets and near absorb sets correspond to error patterns that, due to the structure and imperfections of the LDPC code, cannot easily be corrected using standard correction methods. The rows of convex portions that are linearly continuous are inclined at a predetermined angle with respect to an edge of the die film. The parasitic base is formed by the p substrate or well. In one embodiment an XML file is used to configure the new pattern matching utilities. Thus, a crystal quality of the InGaN semiconductor layer 13 is improved.