An apparatus for testing plural pixels arranged in a matrix array on a TFT substrate comprises an electron gun for incidenting the electron beam to the TFT substrate, a secondary electron detector for detecting the amount of secondary electrons generated by incidenting the electron beam to the TFT substrate, and a stage for carrying the TFT substrate which is held thereon. At least one word appropriate for a document type set according to a voice recognition target is extracted based on an analysis result. A depth information item corresponding to an image captured by an image capturing apparatus is received. A method of manufacturing a machined product according to an embodiment of the present invention is a method of manufacturing the machined product by using the cutting tool.