An H-shaped test key layout for exclusively monitoring 3-foil lens aberration effects during the fabrication of deep-trench capacitor memory devices is disclosed. The scoop portion of the grinder is sized to fit into the standard bags used for whole bean packaging, eliminating the need for a separate storage vessel or the need to pour the beans from their bag into the grinder. The device allows one to obtain a barium distribution in the CRT that is more uniform and wider than that obtainable with a conventional getter device. When the edge pixel does not exist in the noticed region, a smoothing processing is carried out.