A test method for testing a reflective LCD array and apparatus including a mirror read pass transistor. In order to avoid adjustment of an analog electronic system with potentiometers, laser trimming or individual resistor fitment, the controller ascertains the temperature of the APD in such a way that the sensitivity of the APD corresponds to its reference sensitivity at any temperature. In a first mode, the ring gear is locked to the first magnet assembly and configured to rotate with the sun gear, the ring gear being configured to prevent the rotation of the at least one planet gear about its own axis causing the planet carrier to rotate at the same speed as the sun gear. A pawl hole and a pawl are formed on the stationary portion, and the width of the pawl hole is greater than that of the movable portion.