According to an example embodiment, a semiconductor device test system includes a semiconductor device and a test apparatus. The data input unit transmits a data depending on the input data to the node, when both of a first clock signal and a second clock signal that are driven independently from each other are at a first level. In addition to standard aes, the flexible aes instruction allows an AES-like cipher with 20 rounds to be specified or a \u201cone round\u201d pass. When an encoding sequence control unit determines that the encoded data amount in the first memory has exceeded the target data amount, the encoding sequence control unit discards data in the first memory, sets a quantization parameter for a higher compression ratio for the first encoding unit, and causes the first encoding unit to execute encoding. The heating element is exposed to the environment, but the remaining electrical parts of the device are not exposed. One of the transmitted signals is a conventional swept frequency and the other is a mono-frequency signal.