A sample processing apparatus includes a stage for supporting a sample, a first temperature controller for controlling a temperature of the sample, an ion beam generator for irradiating the sample with an ion beam, and a detector for detecting a signal emitted from the sample in response to the irradiation of the ion beam. White coatings may be formed on articles using pulsed direct current or alternating current. If the wavelet analysis result of the TDR signal does not correspond to one or more reference wavelet analysis results, it is indicated that the anomaly in the wire lacks one or more known characteristics of one or more known anomalies corresponding to one or more reference wavelet analysis results in the library. The number of pages corresponding to the determination results is set. A power supply preferably supplies respective first and second direct current voltages to each of the storage devices, and the circuit respectively connects the dc voltages to the storage devices in a selected sequential order. In one instance, a rust-resistant tape in accordance with the present invention can be directly applied to a metal surface to be protected.