Techniques for processing magnetic devices are provided. The invention herein discloses an algorithm that is used to provide an explanation of the primary factors influencing the score, where a rich data feed is provided to the facility implementing the algorithm. The bonus accumulator accumulates bonus elements based on predetermined criteria. When one of the voltage detector units receives the detection instruction with the address being same as a self-address thereof, the voltage detector unit detects output voltages of unit cells and transmits the detected result to the low voltage line CPU. The methods may include forming a region that provides enhanced oxidation under a fin-shaped FET body.