A device and method for providing computer operation diagnostics. In one embodiment, the method comprises determining a region in an image. The second output port of the second ATS device is coupled to the second input port of the first ATS device. This light is input to the PCS, in which the PCS separates p-polarized light and s-polarized light at the polarizing beam splitter. Consequently, a probe card can be provided wherein adhesion of molten material to the probe needles is suppressed, and wherein increased contact resistance due to oxidization of the material which has melted and adhered is prevented.