The present application describes a system and method for testing semiconductor devices and specifically for testing mixed signal semiconductor devices. The duplexer is operated by tuning the first tunable bandpass filter to provide a passband corresponding to an assigned transmit frequency, and tuning the second tunable bandpass filter to provide a passband offset from an assigned receive frequency, when the duplexer is operated in a transmit mode. The dynamic part includes an inner sleeve group in the center and an outer sleeve group outside the inner sleeve group.