Provided is a multiband low noise amplifier including a first transistor, an input matching circuit, and a first capacitor. In a set up procedure, a test pattern is printed using the nozzles of adjacent jetting modules, and the pattern is analyzed to detect a stitch error in the overlap regions. The above-explained calculated value is, for example, an average of the brightness of pixels overlapping each sub pattern of the main pattern. 45 both inclusive, when an impact bar of the split Hopkinson’s bar tester collides with the golf ball at a speed of 14.