1459862256-a28bf5b3-d2ac-4859-b485-a456c3d6bd09

A single evaluation portion is formed by disposing a plurality of MIS transistors used for evaluation having substantially the same structure as that of an actually used MIS transistor. The elastic sealing member is provided with liquid flow paths communicating with the liquid supply paths and the communication passage. A user interface is displayed on a display. At least one tear strip is provided such that it can be torn through the package when the package is closed to form an opening.