A technique for enhancing the performance of a memory- and logic-equipped semiconductor device is provided. A color characteristic measurement apparatus which has a test chart as a subject of an image pickup machine, a hole made in the test chart, a black box placed on a rear face of the test chart and formed on an inner surface in black, and a light output section placed in the black box at a position where the light output section can be observed through the hole from the outside. The user controllable input unit is adapted to receive a first command at an instant.