A computer-implemented method and apparatus are disclosed for use in the capture, compilation, production and delivery of integrated educational andor training programs in digital form. The inventions pertain to methods of forming one andor two dimensional features on a substrate having the feature density increased to six times of what is possible using the standard optical lithographic technique; and methods to release the overlay requirement when patterning the critical layers of semiconductor devices. The detection of the product may cause the advancement of packaging material and the product through a nipping station to form a package.