A system and method is provided that facilitates the administration of an application in accordance with the present invention. A sampling plan provides information on specific measure points within a die, a die being the section on the wafer that will eventually become a single chip after processing. The intended destination is stored in a memory within the tag. In another embodiment, pre-computed look-up tables are employed in phase and frequency tracking accelerators to ease timing closure and simplify accelerator circuit. The first and second mediums having different indices of refraction to facilitate reflection of the output light from the light source off a reflective surface of the integrating tunnel and propagating the reflected light substantially towards an output end of the integrating tunnel.