A method and apparatus for forming a crystalline semiconductor layer on a substrate are provided. In one embodiment, the technique uses an algorithm that requires limited aggregate information to continually monitor the network for re-optimization opportunities. Data from incoming requests are mapped to a format understandable to an appropriate application. The managing server then allocates an IP address to the client’s satellite receiving means, and a satellite link is established between the client’s satellite receiving means and the managing server based upon the stored unique information of the given client. The measured electrical characteristics are used to identify a location of the alignment structure. If the stroke encloses an area that contains at least a portion of a plurality of displayed objects, each of the displayed objects is simultaneously selected.