A method, computer program product, and data processing system for determining test sequences’ coverage of events in testing a semiconductor design are disclosed. Axial or compressive strain across the D-shaped cross section may be determined by measuring the change in polarization or birefringence of the light output from the sensor. The printer may use, for instance, a pagewidth drop-on-demand inkjet printhead. The method further comprises inserting the first data cell at the tail of the retransmit queue and retransmitting a second data cell at the head of the retransmit queue.