Methods and apparatuses are disclosed that can introduce deliberate semiconductor film variation during semiconductor manufacturing to compensate for radial processing differences, to determine optimal device characteristics, or produce small production runs. A safety protocol is embedded within the standard serial protocol by adding to special error detecting data redundant with the protocol of the standard serial network. While access to the web service is permitted via at least one server, the web service is updated on at least one other server. The aging effect of the timing arc is calculated based on the probability.