The present invention for reducing memory usage of an object oriented program. The method involves directing a high intensity beam of light at a surface of a sample of silicon or semi-conductor structure to be tested producing a photoluminescence image, producing a reflected light image, combining the information in the two images to detect, map and identify andor characterize micro-defects in the silicon or semi-conductor structure. The system of linkages is configured to compensate for any over-travel resulting from possible tolerance variations. The game designer provides program code, from which compile-time steps determine a set of raw features.