A method for determining a predicted soft error rate for an integrated circuit device design includes calculating the SER based on a predicted amount of charge imparted by a one or more particles to the integrated circuit device based on the design. A substrate is provided and a first layer of dielectric material is grown on the substrate. The first structured major surface includes a plurality of unitary discrete structures. A positioning pin is movably inserted in the hole and an end of the positioning pin extends from the hole and has a tapered periphery.