A system and method are disclosed for providing an active current assist with analog bypass for a switcher circuit. The position element can be used to determine the position of a portion of an instrument. The scan line drive circuit scans the second screen in one of a one-line-at-a-time operation and a plural-line-at-a-time operation by using the scan signals every time the scan line drive circuit scans at least one frame of the first screen in a one-line-at-a-time operation by using the scan signals.