A method includes dividing a semiconductor wafer into a plurality of dies areas, generating a map of the semiconductor wafer, scanning each of the plurality of die areas of the semiconductor wafer with a laser, and adjusting a parameter of the laser during the scanning based on a value of the die areas identified by the map of the semiconductor wafer. The circuit board built-in connector and the catcher can be miniaturized, have high cable pulled-out strength and resistance to noise and electrostatic property, and are easy for installation and high in line operability. The production of the high melt flow propylene impact copolymer may occur in one or more polymerization reactors, utilizing standard hydrogen concentration, and no visbreaking.