A scanning device, a laser projector and an optical device that are capable of accomplishing a wide scanning area in a simple manner include a galvanomirror that is a scanning part scans a laser light in a two-dimensional direction. The structure includes a well region formed above an oxide insulation layer. The method saves the time required for testing the reliability of a large numbers of semiconductor devices, and will not cause damages to the second set of semiconductor devices. Similarly, the PPE can receive and the FFE can send packet routing information at each one of a sequence of similar time quanta.