An approach for cancelling reverse reflections in very-fast transmission line pulse testing of an electrostatic discharge device in a semiconductor is provided. The integrated grid comprises three types of grid unit cells having power rails and clock lines. The elastic section is formed inside the connecting assembly and can be provided on an exterior thereof. The sealing profiles have areas of different hardness arranged in alternation in the transverse direction perpendicular to the respective profile longitudinal plane, the sealing profiles of butt sides that lie against each other differing from each other in the arrangement of the areas of different hardness in the transverse direction. The second thin layer will not form a gas during this treatment and will have a sufficient density to limit or prevent the spread andor diffusion of the gas generated in the first layer. The extracted optimized source document image blocks are then aggregated and used to construct an image capture parameter optimized image of the source document.