An industrial controller simulation system is provided. Typical implementations use a reversed biased diode containing not intentionally doped optically active region sandwiched between conductive layers of p-doped and n-doped semiconductor layers, respectively. For example, passive RFID tags are attached to an aviation asset. The error correction circuit further calculates a difference value of the DC component of the error macroblock using the difference values of DC components stored in the memory, to add the difference value calculated to the corrected picture generated from the reference picture. The lookup mechanism receives from the datapath element a result based on the comparison.