In a plasma display device, a second terminal of a first transistor, whose first terminal is connected to an electrode, is connected to a power source for supplying a first voltage. In a semiconductor body, active semiconductor regions are formed which are mutually insulated by field oxide regions. The bit line is electrically connected to a drain of the memory cell. The invention also relates to soybean cultivars or breeding cultivars, and plant parts derived from soybean cultivar S130059. A checking apparatus, including at least a gauging or measuring head, includes a stationary structure and at least a support structure for the head, coupled to the stationary structure in an adjustable and removable way.