Methods are disclosed for determining tunnel oxide reliability of flash memory devices in a wafer prior to sorting and packaging without damaging or stressing the devices. The foreign material defines a material first surface and a substantially opposed material second surface and the channel extends through the foreign material between the material first and second surfaces. In one embodiment, a method of video frame interpolation includes receiving forward and backward motion estimation data based on a first video frame and a second, subsequent, video frame. In other embodiments, modulation in accordance with similar parameters can be applied to other spinal or peripheral locations to address other indications. An exemplary solver propagates truth assignments to constraints of a formula, and tracks which truth assignments are relevant for determining satisfiability of the formula.