With infrared sensors, repeatability and accuracy can become an issue when there are thermal gradients between the sensor and an underlying printed circuit board. A source system, such as an OBIRCH system, is used to analyze and detect faults in an integrated circuit on a semiconductor die. The management module of the chassis in which the blades and power supplies are located uses this information to manage the power reduction of blades when the system is operating in an over-subscription mode and a power supply fails.