The present invention concerns a method for setting the system parameters of a scanning microscope, preferably a confocal scanning microscope, acquisition of an image of the specimen performed with the scanning microscope being controlled by a control computer. A ME-MTJ device includes an exchange bias-controlled switching element and a pinned ferromagnetic layer on an antiferromagnetic layer. In this method, each pixel in a one image is re-combined with alternative pixels in a second image and a new disparity measure is determined for each of the re-matched pixel combinations.