A method, apparatus and computer program product are provided for implementing deterministic based broken scan chain diagnostics. The first end of the sub-frame is operatively pivotally attached to the main frame along a main frame pivot axis. Compared to conventional instruments, the disclosed instruments afford faster sample loading and unloading, for example, through the use of disposable libraries of material samples. The indirect X-ray sensor also includes one or more silicon dies with an array of photo-sensing circuits each of which including a contact at a top surface of the one or more silicon dies. The magnetic disk apparatus includes a read-out control unit that controls to read-out sector data by emulating an existing format, and a write-in control unit that controls to write sector data by emulating the existing format, when the magnetic disk apparatus receives a read command or a write command based on a format that is different from a format of the magnetic disk apparatus from a host.