A scanning electron microscope comprises: an electron gun for emitting an electron beam; a system of condenser lenses; scanning coils; and an objective lens having inner and outer magnetic polepieces to form a magnetic field lens below the lower ends of the polepieces. One exemplary component, among others, includes a boron carbide component comprised of a homogeneous boron carbide powder. Thus, the electroplating device can include a wave generator. Upon a reset condition, a reset configuration bit can be used to determine whether the memory will be reset with the default configuration or the active configuration that was being used before the reset. The elastic tension structure comprises bellows formed by an axial pail of the wall of the parts.